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X-ray photoelectron spectroscopy studies of indium tin oxide nanocrystalline powder

Identifieur interne : 009215 ( Main/Repository ); précédent : 009214; suivant : 009216

X-ray photoelectron spectroscopy studies of indium tin oxide nanocrystalline powder

Auteurs : RBID : Pascal:06-0372216

Descripteurs français

Pascal (Inist)
- Etain oxyde, Nanocristal, Composition chimique, Distribution concentration, Profil profondeur, Profilé.
Wicri :
- concept : Profilé.

English descriptors

KwdEn :
- Chemical composition, Concentration distribution, Depth profiles, Nanocrystal, Shaped piece, Tin oxides.

Abstract

Indium tin oxide films and coatings are widely used and can be produced by different techniques including dip and spin coating of suspensions of nanoparticles. To achieve high-quality films, the nanopowder has to be fully characterized. Hence, three coprecipitated nanocrystalline indium tin oxide powders of different particle size were investigated by use of X-ray photoelectron spectroscopy. The analysis indicated that indium and tin are in the oxide state; that is, no metallic component could be observed. In addition, measurements by use of X-ray diffraction, scanning electron microscopy/energy dispersive X-ray spectroscopy and transmission electron microscopy were performed. They showed that indium tin oxide primary particles are slightly elliptical and facetted in shape. The powders have a body-centered cubic lattice type, and the lattice parameter is 1.01 nm. Measured by both X-ray photoelectron spectroscopy and energy dispersive X-ray spectrometry, the tin content was determined to be 5-6 at.%.

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Le document en format XML

<record><TEI><teiHeader><fileDesc><titleStmt><title xml:lang="en" level="a">X-ray photoelectron spectroscopy studies of indium tin oxide nanocrystalline powder</title>
<author><name sortKey="Pujilaksono, Bagas" uniqKey="Pujilaksono B">Bagas Pujilaksono</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Department of Materials Science and Engineering, Chalmers University of Technology</s1>
<s2>412 96 Göteborg</s2>
<s3>SWE</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
</inist:fA14>
<country>Suède</country>
<wicri:noRegion>412 96 Göteborg</wicri:noRegion>
</affiliation>
</author>
<author><name sortKey="Klement, Uta" uniqKey="Klement U">Uta Klement</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Department of Materials Science and Engineering, Chalmers University of Technology</s1>
<s2>412 96 Göteborg</s2>
<s3>SWE</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
</inist:fA14>
<country>Suède</country>
<wicri:noRegion>412 96 Göteborg</wicri:noRegion>
</affiliation>
</author>
<author><name sortKey="Nyborg, Lars" uniqKey="Nyborg L">Lars Nyborg</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Department of Materials Science and Engineering, Chalmers University of Technology</s1>
<s2>412 96 Göteborg</s2>
<s3>SWE</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
</inist:fA14>
<country>Suède</country>
<wicri:noRegion>412 96 Göteborg</wicri:noRegion>
</affiliation>
</author>
<author><name sortKey="Jelvestam, Urban" uniqKey="Jelvestam U">Urban Jelvestam</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Department of Materials Science and Engineering, Chalmers University of Technology</s1>
<s2>412 96 Göteborg</s2>
<s3>SWE</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
</inist:fA14>
<country>Suède</country>
<wicri:noRegion>412 96 Göteborg</wicri:noRegion>
</affiliation>
</author>
<author><name sortKey="Hill, Sven" uniqKey="Hill S">Sven Hill</name>
<affiliation wicri:level="3"><inist:fA14 i1="02"><s1>Nanogate Technologies GmbH</s1>
<s2>66121 Saarbrücken</s2>
<s3>DEU</s3>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
</inist:fA14>
<country>Allemagne</country>
<placeName><region type="land" nuts="2">Sarre (Land)</region>
<settlement type="city">Sarrebruck</settlement>
</placeName>
</affiliation>
</author>
<author><name sortKey="Burgard, Detlef" uniqKey="Burgard D">Detlef Burgard</name>
<affiliation wicri:level="3"><inist:fA14 i1="02"><s1>Nanogate Technologies GmbH</s1>
<s2>66121 Saarbrücken</s2>
<s3>DEU</s3>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
</inist:fA14>
<country>Allemagne</country>
<placeName><region type="land" nuts="2">Sarre (Land)</region>
<settlement type="city">Sarrebruck</settlement>
</placeName>
</affiliation>
</author>
</titleStmt>
<publicationStmt><idno type="inist">06-0372216</idno>
<date when="2005">2005</date>
<idno type="stanalyst">PASCAL 06-0372216 INIST</idno>
<idno type="RBID">Pascal:06-0372216</idno>
<idno type="wicri:Area/Main/Corpus">008B71</idno>
<idno type="wicri:Area/Main/Repository">009215</idno>
</publicationStmt>
<seriesStmt><idno type="ISSN">1044-5803</idno>
<title level="j" type="abbreviated">Mater. charact.</title>
<title level="j" type="main">Materials characterization</title>
</seriesStmt>
</fileDesc>
<profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Chemical composition</term>
<term>Concentration distribution</term>
<term>Depth profiles</term>
<term>Nanocrystal</term>
<term>Shaped piece</term>
<term>Tin oxides</term>
</keywords>
<keywords scheme="Pascal" xml:lang="fr"><term>Etain oxyde</term>
<term>Nanocristal</term>
<term>Composition chimique</term>
<term>Distribution concentration</term>
<term>Profil profondeur</term>
<term>Profilé</term>
</keywords>
<keywords scheme="Wicri" type="concept" xml:lang="fr"><term>Profilé</term>
</keywords>
</textClass>
</profileDesc>
</teiHeader>
<front><div type="abstract" xml:lang="en">Indium tin oxide films and coatings are widely used and can be produced by different techniques including dip and spin coating of suspensions of nanoparticles. To achieve high-quality films, the nanopowder has to be fully characterized. Hence, three coprecipitated nanocrystalline indium tin oxide powders of different particle size were investigated by use of X-ray photoelectron spectroscopy. The analysis indicated that indium and tin are in the oxide state; that is, no metallic component could be observed. In addition, measurements by use of X-ray diffraction, scanning electron microscopy/energy dispersive X-ray spectroscopy and transmission electron microscopy were performed. They showed that indium tin oxide primary particles are slightly elliptical and facetted in shape. The powders have a body-centered cubic lattice type, and the lattice parameter is 1.01 nm. Measured by both X-ray photoelectron spectroscopy and energy dispersive X-ray spectrometry, the tin content was determined to be 5-6 at.%.</div>
</front>
</TEI>
<inist><standard h6="B"><pA><fA01 i1="01" i2="1"><s0>1044-5803</s0>
</fA01>
<fA03 i2="1"><s0>Mater. charact.</s0>
</fA03>
<fA05><s2>54</s2>
</fA05>
<fA06><s2>1</s2>
</fA06>
<fA08 i1="01" i2="1" l="ENG"><s1>X-ray photoelectron spectroscopy studies of indium tin oxide nanocrystalline powder</s1>
</fA08>
<fA11 i1="01" i2="1"><s1>PUJILAKSONO (Bagas)</s1>
</fA11>
<fA11 i1="02" i2="1"><s1>KLEMENT (Uta)</s1>
</fA11>
<fA11 i1="03" i2="1"><s1>NYBORG (Lars)</s1>
</fA11>
<fA11 i1="04" i2="1"><s1>JELVESTAM (Urban)</s1>
</fA11>
<fA11 i1="05" i2="1"><s1>HILL (Sven)</s1>
</fA11>
<fA11 i1="06" i2="1"><s1>BURGARD (Detlef)</s1>
</fA11>
<fA14 i1="01"><s1>Department of Materials Science and Engineering, Chalmers University of Technology</s1>
<s2>412 96 Göteborg</s2>
<s3>SWE</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
</fA14>
<fA14 i1="02"><s1>Nanogate Technologies GmbH</s1>
<s2>66121 Saarbrücken</s2>
<s3>DEU</s3>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
</fA14>
<fA20><s1>1-7</s1>
</fA20>
<fA21><s1>2005</s1>
</fA21>
<fA23 i1="01"><s0>ENG</s0>
</fA23>
<fA43 i1="01"><s1>INIST</s1>
<s2>14386</s2>
<s5>354000127074110010</s5>
</fA43>
<fA44><s0>0000</s0>
<s1>© 2006 INIST-CNRS. All rights reserved.</s1>
</fA44>
<fA45><s0>10 ref.</s0>
</fA45>
<fA47 i1="01" i2="1"><s0>06-0372216</s0>
</fA47>
<fA60><s1>P</s1>
</fA60>
<fA61><s0>A</s0>
</fA61>
<fA64 i1="01" i2="1"><s0>Materials characterization</s0>
</fA64>
<fA66 i1="01"><s0>USA</s0>
</fA66>
<fC01 i1="01" l="ENG"><s0>Indium tin oxide films and coatings are widely used and can be produced by different techniques including dip and spin coating of suspensions of nanoparticles. To achieve high-quality films, the nanopowder has to be fully characterized. Hence, three coprecipitated nanocrystalline indium tin oxide powders of different particle size were investigated by use of X-ray photoelectron spectroscopy. The analysis indicated that indium and tin are in the oxide state; that is, no metallic component could be observed. In addition, measurements by use of X-ray diffraction, scanning electron microscopy/energy dispersive X-ray spectroscopy and transmission electron microscopy were performed. They showed that indium tin oxide primary particles are slightly elliptical and facetted in shape. The powders have a body-centered cubic lattice type, and the lattice parameter is 1.01 nm. Measured by both X-ray photoelectron spectroscopy and energy dispersive X-ray spectrometry, the tin content was determined to be 5-6 at.%.</s0>
</fC01>
<fC02 i1="01" i2="3"><s0>001B80A30F</s0>
</fC02>
<fC03 i1="01" i2="3" l="FRE"><s0>Etain oxyde</s0>
<s2>NK</s2>
<s5>55</s5>
</fC03>
<fC03 i1="01" i2="3" l="ENG"><s0>Tin oxides</s0>
<s2>NK</s2>
<s5>55</s5>
</fC03>
<fC03 i1="02" i2="X" l="FRE"><s0>Nanocristal</s0>
<s5>56</s5>
</fC03>
<fC03 i1="02" i2="X" l="ENG"><s0>Nanocrystal</s0>
<s5>56</s5>
</fC03>
<fC03 i1="02" i2="X" l="SPA"><s0>Nanocristal</s0>
<s5>56</s5>
</fC03>
<fC03 i1="03" i2="3" l="FRE"><s0>Composition chimique</s0>
<s5>57</s5>
</fC03>
<fC03 i1="03" i2="3" l="ENG"><s0>Chemical composition</s0>
<s5>57</s5>
</fC03>
<fC03 i1="04" i2="X" l="FRE"><s0>Distribution concentration</s0>
<s5>58</s5>
</fC03>
<fC03 i1="04" i2="X" l="ENG"><s0>Concentration distribution</s0>
<s5>58</s5>
</fC03>
<fC03 i1="04" i2="X" l="SPA"><s0>Distribución concentración</s0>
<s5>58</s5>
</fC03>
<fC03 i1="05" i2="3" l="FRE"><s0>Profil profondeur</s0>
<s5>59</s5>
</fC03>
<fC03 i1="05" i2="3" l="ENG"><s0>Depth profiles</s0>
<s5>59</s5>
</fC03>
<fC03 i1="06" i2="X" l="FRE"><s0>Profilé</s0>
<s5>60</s5>
</fC03>
<fC03 i1="06" i2="X" l="ENG"><s0>Shaped piece</s0>
<s5>60</s5>
</fC03>
<fC03 i1="06" i2="X" l="SPA"><s0>Perfil</s0>
<s5>60</s5>
</fC03>
<fN21><s1>247</s1>
</fN21>
<fN44 i1="01"><s1>OTO</s1>
</fN44>
<fN82><s1>OTO</s1>
</fN82>
</pA>
</standard>
</inist>
</record>

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X-ray photoelectron spectroscopy studies of indium tin oxide nanocrystalline powder

X-ray photoelectron spectroscopy studies of indium tin oxide nanocrystalline powder

Descripteurs français

English descriptors

Abstract

Links toward previous steps (curation, corpus...)

Links to Exploration step

Le document en format XML

Pour manipuler ce document sous Unix (Dilib)

Pour mettre un lien sur cette page dans le réseau Wicri